On the Coiflet-TDS Solution for Scattering by Sharp Coated Cones and Its Application to Emissivity Determination

作者:Jin, M (Jin, Ming)[ 1,2 ] ; Bai, M (Bai, Ming)[ 2 ] ; Zhang, LS (Zhang, Lisha)[ 3 ] ; Pan, GW (Pan, Guangwen)[ 3 ] ; Miao, JG (Miao, Jungang)[ 2 ]

IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING

卷: 54  期: 3  页: 1399-1409

DOI: 10.1109/TGRS.2015.2480403

出版年: MAR 2016

摘要

We report the continuous effects in modeling sharp coated cones as calibration targets by surface integration solutions. The Coiflet based method of moment (MoM) is employed in conjunction with the thin dielectric sheet approximation (TDS). The Coifman wavelets inherit mathematical superiority in the Galerkin procedure, e.g., the high precision one-point quadrature for fast matrix filling, local multi-resolution ability, and high regularity with Hlder index 1.449 in smoothness. Local geometry refinements are implemented to reduce the errors by TDS approximation in modeling very sharp structures. The Coiflet-TDS solution is compared to an in-house FDTD package and good agreement has been observed. The presented MoM is also compared against the RWG-TDS based commercial software FEKO, and the Coiflet-TDS demonstrates more robust in modeling surfaces with sharp geometries. Finally, the emissivity of a calibrator is studied versus directions and polarizations, and its variation trends are observed.

通讯作者地址: Pan, GW (通讯作者)

Arizona State Univ, Dept Elect Engn, Tempe, AZ 85281 USA.

地址:

[ 1 ] Chinese Acad Sci, Inst Remote Sensing & Digital Earth, State Key Lab Remote Sensing Sci, Beijing 100101, Peoples R China

[ 2 ] Beihang Univ, Sch Elect Informat Engn EIE, Beijing 100191, Peoples R China

[ 3 ] Arizona State Univ, Dept Elect Engn, Tempe, AZ 85281 USA